BrightView Systems has managed to successfully integrate its WAM (Wide Area Metrology) process metrology and mapping solution for thin-film PV manufacturers at Signet Solar's production line in Mochau, Germany.

The WAM tool has demonstrated its contribution to both panel efficiency and line productivity via its in-line, true-cell-metrology and measurement capabilities and associated suite of control applications for excursion detection, chamber matching and process window optimization. Signet Solar embedded the system into their production flow and was able to implement fully automated continuous full-panel process monitoring and feedback on 100% of production panels.

Commenting on the test results, BrightView's CEO Benny Shoham said: "Signet Solar has put our system through rigorous testing, allowing us to validate our vision in a high volume production line using actual panel performance data. Their talented team, working with the BrightView state-of-the-art WAM solution, was able to deliver major improvements to line productivity in a very short time. We are excited by the excellent results they achieved, and look forward to continue working with Signet Solar on their next production milestone and process improvement roadmap, as well as accelerate efficiency and productivity gains for the thin film PV industry."